Probing Diffuse Polymer Brush Interfaces Using Resonant Soft X-ray Scattering

Guilhem X. De Hoe; Jun Mao; Zhang Jiang; Seth B. Darling; Matthew V. Tirrell; Wei Chen

doi:10.1080/08940886.2020.1784698

Probing Diffuse Polymer Brush Interfaces Using Resonant Soft X-ray Scattering

Guilhem X. De Hoe, Jun Mao, Zhang Jiang, Seth B. Darling, Matthew V. Tirrell, Wei Chen

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	24-30
Number of pages	7
Journal	Synchrotron Radiation News
Volume	33
Issue number	4
DOIs	https://doi.org/10.1080/08940886.2020.1784698
State	Published - Aug 3 2020
Externally published	Yes

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10.1080/08940886.2020.1784698

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@article{1544d59d07ad47a6bd94b36536de4920,

title = "Probing Diffuse Polymer Brush Interfaces Using Resonant Soft X-ray Scattering",

author = "{De Hoe}, {Guilhem X.} and Jun Mao and Zhang Jiang and Darling, {Seth B.} and Tirrell, {Matthew V.} and Wei Chen",

year = "2020",

month = aug,

day = "3",

doi = "10.1080/08940886.2020.1784698",

language = "English (US)",

volume = "33",

pages = "24--30",

journal = "Synchrotron Radiation News",

issn = "0894-0886",

publisher = "Gordon Publications",

number = "4",

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TY - JOUR

T1 - Probing Diffuse Polymer Brush Interfaces Using Resonant Soft X-ray Scattering

AU - De Hoe, Guilhem X.

AU - Mao, Jun

AU - Jiang, Zhang

AU - Darling, Seth B.

AU - Tirrell, Matthew V.

AU - Chen, Wei

PY - 2020/8/3

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M3 - Article

AN - SCOPUS:85089940412

SN - 0894-0886

VL - 33

SP - 24

EP - 30

JO - Synchrotron Radiation News

JF - Synchrotron Radiation News

IS - 4

ER -

Probing Diffuse Polymer Brush Interfaces Using Resonant Soft X-ray Scattering

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