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Prediction of leakage power under process uncertainties
Hongliang Chang
,
Sachin S Sapatnekar
Electrical and Computer Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
43
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Scopus citations
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Keyphrases
Correlated Lognormal
66%
Correlated Processes
33%
Correlation Structure
33%
Dominant State
33%
Full-chip
33%
Gate Tunneling Leakage
33%
Improved Approach
33%
Leakage Current
33%
Leakage Mechanism
33%
Leakage Power
100%
Lognormal
33%
Lognormal Distribution
33%
Probability Distribution
33%
Process Uncertainty
100%
Process Variation
66%
Runtime Efficiency
33%
Spatial Correlation
100%
Spatial Correlation Model
33%
Spatially Correlated
33%
Subthreshold
33%
Total Leakage Current
33%
Engineering
Correlation Model
25%
Input State
25%
Lognormal
75%
Lognormal Distribution
25%
Principal Components
25%
Process Parameter
25%
Process Variation
50%
Spatial Correlation
100%
Tunnel Construction
25%
Mathematics
Correlated Process
25%
Correlation Model
25%
Correlation Structure
25%
Input State
25%
Lognormal Distribution
25%
Principal Components
25%
Probability Distribution
25%
Process Parameter
25%
Spatial Correlation
100%
Standard Deviation
25%
Summation
25%