Prediction of leakage power under process uncertainties

Keyphrases

• Leakage Power 100%
• Spatial Correlation 100%
• Process Uncertainty 100%
• Process Variation 66%
• Correlated Lognormal 66%
• Probability Distribution 33%
• Improved Approach 33%
• Subthreshold 33%
• Leakage Current 33%
• Lognormal 33%
• Total Leakage Current 33%
• Correlation Structure 33%
• Lognormal Distribution 33%
• Gate Tunneling Leakage 33%
• Spatially Correlated 33%
• Leakage Mechanism 33%
• Run-time Efficiency 33%
• Correlated Processes 33%
• Spatial Correlation Model 33%
• Dominant State 33%
• Full-chip 33%

Engineering

• Spatial Correlation 100%
• Lognormal 75%
• Process Variation 50%
• Process Parameter 25%
• Correlation Model 25%
• Input State 25%
• Principal Components 25%
• Tunnel Construction 25%
• Lognormal Distribution 25%

Earth and Planetary Sciences

• Standard Deviation 100%