TY - GEN
T1 - Predicting circuit aging using ring oscillators
AU - Sengupta, Deepashree
AU - Sapatnekar, Sachin S.
N1 - Copyright:
Copyright 2014 Elsevier B.V., All rights reserved.
PY - 2014
Y1 - 2014
N2 - This paper presents a method for inferring circuit delay shifts due to bias temperature instability using ring oscillator (ROSC) sensors. This procedure is based on presilicon analysis, postsilicon ROSC measurements, a new aging analysis model called the Upperbound on fMax (UofM), and a look-up table that stores a precomputed degradation ratio that translates delay shifts in the ROSC to those in the circuits. This method not only yields delay estimates within 0.2% of the true values with very low runtime, but is also independent of temperature and supply voltage variations.
AB - This paper presents a method for inferring circuit delay shifts due to bias temperature instability using ring oscillator (ROSC) sensors. This procedure is based on presilicon analysis, postsilicon ROSC measurements, a new aging analysis model called the Upperbound on fMax (UofM), and a look-up table that stores a precomputed degradation ratio that translates delay shifts in the ROSC to those in the circuits. This method not only yields delay estimates within 0.2% of the true values with very low runtime, but is also independent of temperature and supply voltage variations.
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U2 - 10.1109/ASPDAC.2014.6742929
DO - 10.1109/ASPDAC.2014.6742929
M3 - Conference contribution
AN - SCOPUS:84897850084
SN - 9781479928163
T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
SP - 430
EP - 435
BT - 2014 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014 - Proceedings
T2 - 2014 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014
Y2 - 20 January 2014 through 23 January 2014
ER -