Predicting circuit aging using ring oscillators

Deepashree Sengupta, Sachin S. Sapatnekar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Scopus citations

Abstract

This paper presents a method for inferring circuit delay shifts due to bias temperature instability using ring oscillator (ROSC) sensors. This procedure is based on presilicon analysis, postsilicon ROSC measurements, a new aging analysis model called the Upperbound on fMax (UofM), and a look-up table that stores a precomputed degradation ratio that translates delay shifts in the ROSC to those in the circuits. This method not only yields delay estimates within 0.2% of the true values with very low runtime, but is also independent of temperature and supply voltage variations.

Original languageEnglish (US)
Title of host publication2014 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014 - Proceedings
Pages430-435
Number of pages6
DOIs
StatePublished - Mar 27 2014
Event2014 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014 - Suntec, Singapore
Duration: Jan 20 2014Jan 23 2014

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Other

Other2014 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014
CountrySingapore
CitySuntec
Period1/20/141/23/14

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