TY - JOUR
T1 - Polycrystalline Sm(Co,Cu)5 films with perpendicular anisotropy grown on (0 0 0 2) Ru(Cr)
AU - Liu, Xiaoqi
AU - Zhao, Haibao
AU - Kubota, Yukiko
AU - Wang, Jian Ping
PY - 2008/12/1
Y1 - 2008/12/1
N2 - Polycrystalline Sm-Co-Cu films with SmCo5 phase and (0 0 0 1) texture using a dc magnetron sputtering process were successfully fabricated directly on an (0 0 0 2) Ru(Cr) underlayer on heated glass substrates at 350 °C. The mean grain size of the Sm(CoCu)5 layer is 17 nm, the smallest ever reported on SmCo5 film with perpendicular anisotropy. Strong exchange coupling between grains, as indicated by the coercivity squareness, was found in the obtained Sm(Co,Cu)5 films. An estimated perpendicular magnetic anisotropy constant, as high as 1.4 × 10 8 erg cm-3, was achieved on these films. An 'unusually' high perpendicular coercivity (11 kOe) was found on these exchange-coupled polycrystalline Sm(Co,Cu)5 films. This was explained by a pinning-site model which was supported by the measurement of the coercivity angular dependence.
AB - Polycrystalline Sm-Co-Cu films with SmCo5 phase and (0 0 0 1) texture using a dc magnetron sputtering process were successfully fabricated directly on an (0 0 0 2) Ru(Cr) underlayer on heated glass substrates at 350 °C. The mean grain size of the Sm(CoCu)5 layer is 17 nm, the smallest ever reported on SmCo5 film with perpendicular anisotropy. Strong exchange coupling between grains, as indicated by the coercivity squareness, was found in the obtained Sm(Co,Cu)5 films. An estimated perpendicular magnetic anisotropy constant, as high as 1.4 × 10 8 erg cm-3, was achieved on these films. An 'unusually' high perpendicular coercivity (11 kOe) was found on these exchange-coupled polycrystalline Sm(Co,Cu)5 films. This was explained by a pinning-site model which was supported by the measurement of the coercivity angular dependence.
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U2 - 10.1088/0022-3727/41/23/232002
DO - 10.1088/0022-3727/41/23/232002
M3 - Article
AN - SCOPUS:65249100832
VL - 41
JO - Journal Physics D: Applied Physics
JF - Journal Physics D: Applied Physics
SN - 0022-3727
IS - 23
M1 - 232002
ER -