Point contact current-voltage measurements on individual organic semiconductor grains by conducting probe atomic force microscopy

Tommie W. Kelley, C. Daniel Frisbie

Research output: Contribution to journalArticle

44 Scopus citations

Abstract

Conducting probe atomic force microscopy was demonstrated to provide reproducible point-contact measurements of the current-voltage characteristics of single grains of the organic semiconductors. Au-coated AFM probes were used to identify individual sexithiophene grains ranging from 1 to 6 molecules in thickness. Analysis of the measured current-voltage curves allows estimation of the grain resistivity, carrier density, contact resistance, and the effective barrier height.

Original languageEnglish (US)
Pages (from-to)632-635
Number of pages4
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume18
Issue number2
DOIs
StatePublished - Mar 1 2000

Fingerprint Dive into the research topics of 'Point contact current-voltage measurements on individual organic semiconductor grains by conducting probe atomic force microscopy'. Together they form a unique fingerprint.

  • Cite this