Abstract
Conducting probe atomic force microscopy was demonstrated to provide reproducible point-contact measurements of the current-voltage characteristics of single grains of the organic semiconductors. Au-coated AFM probes were used to identify individual sexithiophene grains ranging from 1 to 6 molecules in thickness. Analysis of the measured current-voltage curves allows estimation of the grain resistivity, carrier density, contact resistance, and the effective barrier height.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 632-635 |
| Number of pages | 4 |
| Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
| Volume | 18 |
| Issue number | 2 |
| DOIs | |
| State | Published - Mar 1 2000 |