Plasmonic light trapping for thin film A-SI:H solar cells

Vivian E. Ferry, Marc A. Verschuuren, Hongbo B.T. Li, Ewold Verhagen, Robert J. Walters, Ruud E.I. Schropp, Harry A. Atwater, Albert Polman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Here we discuss the design, fabrication, and simulation of ultrathin film n-i-p a-Si:H solar cells incorporating light trapping plasmonic back reflectors which exceed the performance of n-i-p cells on randomly textured Asahi substrates. The periodic patterns are made via an inexpensive and scalable nanoimprint method, and are structured directly into the metallic back contact. Compared to reference cells with randomly textured back contacts and flat back contacts, the patterned cells exhibit higher short-circuit current densities and improved overall efficiencies than either reference case. Angle-resolved photocurrent measurements confirm that the enhanced photocurrents are due to coupling to waveguide modes of the cell. Electromagnetic modeling is shown to agree well with measurements, and used to understand further details of the device.

Original languageEnglish (US)
Title of host publicationProgram - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Pages760-765
Number of pages6
DOIs
StatePublished - 2010
Event35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States
Duration: Jun 20 2010Jun 25 2010

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Other

Other35th IEEE Photovoltaic Specialists Conference, PVSC 2010
CountryUnited States
CityHonolulu, HI
Period6/20/106/25/10

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    Ferry, V. E., Verschuuren, M. A., Li, H. B. T., Verhagen, E., Walters, R. J., Schropp, R. E. I., Atwater, H. A., & Polman, A. (2010). Plasmonic light trapping for thin film A-SI:H solar cells. In Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010 (pp. 760-765). [5617101] (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2010.5617101