Abstract
A phase-sensitive frequency-multiplexed optical low-coherence reflectometer is described. This reflectometer can measure optical path-length changes on the order of a few nanometers. The phase sensitivity and frequency multiplexing capability of the interferometer are demonstrated.
Original language | English (US) |
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Pages (from-to) | 39-43 |
Number of pages | 5 |
Journal | Optics Communications |
Volume | 193 |
Issue number | 1-6 |
DOIs | |
State | Published - Jun 15 2001 |
Bibliographical note
Funding Information:This research was supported by National Institutes of Health grants HL 59472-02 and NIH8-R4EY12877A.
Keywords
- Low-coherence reflectometer
- Multiplexing
- Phase measurement
- Polarization maintaining fiber