A phase-sensitive frequency-multiplexed optical low-coherence reflectometer is described. This reflectometer can measure optical path-length changes on the order of a few nanometers. The phase sensitivity and frequency multiplexing capability of the interferometer are demonstrated.
Bibliographical noteFunding Information:
This research was supported by National Institutes of Health grants HL 59472-02 and NIH8-R4EY12877A.
- Low-coherence reflectometer
- Phase measurement
- Polarization maintaining fiber