Abstract
We report performance optimization and stability analysis of aerosol-jet-printed electrolyte-gated transistors (EGTs) based on the polymer semiconductor poly(3-hexylthiophene) (P3HT). EGTs were optimized with respect to printed P3HT thickness and the completed device annealing temperature. EGTs with relatively thin P3HT films (∼50 nm) annealed at 120 C have the best performance and display an unusual combination of metrics including sub-1-V operation, ON/OFF current ratios of 106, OFF currents of <10 -10 A (<10-6 A cm-2), saturation hole mobilities of 1.3 cm2 V-1 s-1, threshold voltages of-0.3 V, and subthreshold swings of 70 mV decade-1. Furthermore, optimized EGTs printed on polyester substrates are extremely robust to bias stress and repeated mechanical bending strain. Collectively, the results suggest that optimized P3HT-based EGTs are promising devices for printed, flexible electronics.
Original language | English (US) |
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Pages (from-to) | 6580-6585 |
Number of pages | 6 |
Journal | ACS Applied Materials and Interfaces |
Volume | 5 |
Issue number | 14 |
DOIs | |
State | Published - Jul 24 2013 |
Keywords
- aerosol jet printing
- device stability
- electrochemical transistor
- electrolyte gating
- ion gel
- poly(3-hexylthiophene)