Papers from the 3rd international SiGe technology and device meeting (Princeton, New Jersey, USA, 15-17 May 2006) (ISTDM 2006)

J. Sturm; E. Fitzgerald; S. Koester; J. Kolodzey; J. Muroto; D. Paul; B. Tillack; S. Zaima; B. Ghyselen; S. Takagi

doi:10.1088/0268-1242/22/1/E01

Papers from the 3rd international SiGe technology and device meeting (Princeton, New Jersey, USA, 15-17 May 2006) (ISTDM 2006)

J. Sturm, E. Fitzgerald, S. Koester, J. Kolodzey, J. Muroto, D. Paul, B. Tillack, S. Zaima, B. Ghyselen, S. Takagi

Electrical and Computer Engineering

Research output: Contribution to journal › Editorial › peer-review

Original language	English (US)
Article number	E01
Pages (from-to)	E01
Journal	Semiconductor Science and Technology
Volume	22
Issue number	1
DOIs	https://doi.org/10.1088/0268-1242/22/1/E01
State	Published - Jan 1 2007

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10.1088/0268-1242/22/1/E01

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AU - Sturm, J.

AU - Fitzgerald, E.

AU - Koester, S.

AU - Kolodzey, J.

AU - Muroto, J.

AU - Paul, D.

AU - Tillack, B.

AU - Zaima, S.

AU - Ghyselen, B.

AU - Takagi, S.

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Papers from the 3rd international SiGe technology and device meeting (Princeton, New Jersey, USA, 15-17 May 2006) (ISTDM 2006)

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