Original language | English (US) |
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Pages (from-to) | 1346-1347 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 14 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - Aug 2008 |
Oxide interfaces under the electron microscope
M. Varela, H. M. Christen, H. N. Lee, L. Petit, T. Schulthess, S. J. Pennycook, W. Luo, S. T. Pantelides, J. Garcia-Barriocanal, C. Leon, J. Santamaria
Research output: Contribution to journal › Article › peer-review
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