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Oscillating structure defects in dielectric diodes
W. C. Cheung
, Brian G Van Ness
Genetics, Cell Biology and Development (TMED)
Research output
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peer-review
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Keyphrases
Dielectric
100%
Diode
100%
Defected Ground Structure
100%
Oscillatory Structure
100%
Electronic Conductivity
50%
Constant Electric Field
50%
Electrical Breakdown
50%
Natural Oscillation Frequency
50%
Metal-dielectric Structure
50%
Fabrication Defects
50%
Metallic Electrodes
50%
Material Science
Dielectric Material
100%
Crystal Defect
100%
Electrical Breakdown
33%
Surface (Surface Science)
33%