Optical reflectivity and ellipsometry studies of the Sm – C*α phase

P. M. Johnson, S. Pankratz, P. Mach, H. T. Nguyen, C. C. Huang

Research output: Contribution to journalArticlepeer-review

70 Scopus citations

Abstract

Both optical reflectivity and ellipsometry data obtained from freestanding films in the Sm - C*α phase of one liquid-crystal compound display characteristic oscillations as a function of temperature. A model for the film consisting of surface anticlinic layers and an interior short-pitched azimuthal helix provides an excellent description of our data. Our results show a linear evolution with temperature of the relative interlayer azimuthal angle. The data enable us to place an upper bound on the degree of distortion in the short-pitched helix.

Original languageEnglish (US)
Pages (from-to)4073-4076
Number of pages4
JournalPhysical review letters
Volume83
Issue number20
DOIs
StatePublished - Jan 1 1999

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Copyright 2017 Elsevier B.V., All rights reserved.

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