Optical pattern recognition and classification invariant to selectable pattern features

J. R. Leger; S. H. Lee

doi:10.1117/12.965620

Optical pattern recognition and classification invariant to selectable pattern features

J. R. Leger, S. H. Lee

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

A coherent optical method of performing pattern recognition has been studied which is invariant to selectable pattern features. Two examples of pattern features frequently encountered in pattern recognition tasks are scale and rotation. A recognition scheme which is invariant to these features is able to detect an object independent of its size and angular orientation. In our case, the recognition scheme not only is invariant to these specific features, but can also be used to measure them.

Original language	English (US)
Pages (from-to)	120-121
Number of pages	2
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	201
DOIs	https://doi.org/10.1117/12.965620
State	Published - Dec 4 1979

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abstract = "A coherent optical method of performing pattern recognition has been studied which is invariant to selectable pattern features. Two examples of pattern features frequently encountered in pattern recognition tasks are scale and rotation. A recognition scheme which is invariant to these features is able to detect an object independent of its size and angular orientation. In our case, the recognition scheme not only is invariant to these specific features, but can also be used to measure them.",

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Optical pattern recognition and classification invariant to selectable pattern features

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