A coherent optical method of performing pattern recognition has been studied which is invariant to selectable pattern features. Two examples of pattern features frequently encountered in pattern recognition tasks are scale and rotation. A recognition scheme which is invariant to these features is able to detect an object independent of its size and angular orientation. In our case, the recognition scheme not only is invariant to these specific features, but can also be used to measure them.
|Original language||English (US)|
|Number of pages||2|
|Journal||Proceedings of SPIE - The International Society for Optical Engineering|
|State||Published - Dec 4 1979|