A null transmission ellipsometry study on free standing films of a band-core compound was reported. The critical exponent associated with the biaxiality through the uniaxial-antiferoelectric biaxial Sm A transition was measured to be 0.82±0.04. It was demonstrated that the critical behavior of the optical biaxiality with the order parameter being a vector was described by the secondary-order parameter of the three-dimensional XY model. A remarkable even-odd layering effect exhibited by the surface layers of freestanding films under an applied electric field in the film plane was also observed.
|Original language||English (US)|
|Journal||Physical Review E - Statistical, Nonlinear, and Soft Matter Physics|
|Issue number||6 1|
|State||Published - Dec 1 2004|