Optical investigations on the biaxial smectic-A phase of a bent-core compound

S. T. Wang, X. F. Han, A. Cady, Z. Q. Liu, A. Kamenev, L. Glazman, B. K. Sadashiva, R. Amaranatha Reddy, C. C. Huang

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

A null transmission ellipsometry study on free standing films of a band-core compound was reported. The critical exponent associated with the biaxiality through the uniaxial-antiferoelectric biaxial Sm A transition was measured to be 0.82±0.04. It was demonstrated that the critical behavior of the optical biaxiality with the order parameter being a vector was described by the secondary-order parameter of the three-dimensional XY model. A remarkable even-odd layering effect exhibited by the surface layers of freestanding films under an applied electric field in the film plane was also observed.

Original languageEnglish (US)
Article number061705
Pages (from-to)061705-1-061705-6
JournalPhysical Review E - Statistical, Nonlinear, and Soft Matter Physics
Volume70
Issue number6 1
DOIs
StatePublished - Dec 1 2004

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