Optical characterization of van der Waals materials via near-field microscopy

Daniel Wintz; Alexander Y. Zhu; Ke Wang; Antonio Ambrosio; Rob Devlin; Jesse Crossno; Philip Kim; Federico Capasso

Optical characterization of van der Waals materials via near-field microscopy

Daniel Wintz
, Alexander Y. Zhu
, Ke Wang
, Antonio Ambrosio
, Rob Devlin
, Jesse Crossno
, Philip Kim
, Federico Capasso

Research output: Contribution to journal › Conference article › peer-review

Abstract

We demonstrate a novel characterization method of van-der-Waals' materials by performing near-field-microscopy of hexagonal-boron-nitride thin films on single-crystal silver. Beyond determining dispersion of optical modes, this technique also enables the direct study of light-matter interactions.

Original language	English (US)
Article number	SW1R.2
Journal	Optics InfoBase Conference Papers
State	Published - Dec 16 2016
Externally published	Yes
Event	CLEO: Science and Innovations, SI 2016 - San Jose, United States Duration: Jun 5 2016 → Jun 10 2016

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Publisher Copyright:
© OSA 2016.

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@article{e68fb7e4973c4eaea9fe7efc154e8ac5,

title = "Optical characterization of van der Waals materials via near-field microscopy",

abstract = "We demonstrate a novel characterization method of van-der-Waals' materials by performing near-field-microscopy of hexagonal-boron-nitride thin films on single-crystal silver. Beyond determining dispersion of optical modes, this technique also enables the direct study of light-matter interactions.",

author = "Daniel Wintz and Zhu, \{Alexander Y.\} and Ke Wang and Antonio Ambrosio and Rob Devlin and Jesse Crossno and Philip Kim and Federico Capasso",

note = "Publisher Copyright: {\textcopyright} OSA 2016.; CLEO: Science and Innovations, SI 2016 ; Conference date: 05-06-2016 Through 10-06-2016",

year = "2016",

month = dec,

day = "16",

language = "English (US)",

journal = "Optics InfoBase Conference Papers",

issn = "2162-2701",

}

TY - JOUR

T1 - Optical characterization of van der Waals materials via near-field microscopy

AU - Wintz, Daniel

AU - Zhu, Alexander Y.

AU - Wang, Ke

AU - Ambrosio, Antonio

AU - Devlin, Rob

AU - Crossno, Jesse

AU - Kim, Philip

AU - Capasso, Federico

PY - 2016/12/16

Y1 - 2016/12/16

N2 - We demonstrate a novel characterization method of van-der-Waals' materials by performing near-field-microscopy of hexagonal-boron-nitride thin films on single-crystal silver. Beyond determining dispersion of optical modes, this technique also enables the direct study of light-matter interactions.

AB - We demonstrate a novel characterization method of van-der-Waals' materials by performing near-field-microscopy of hexagonal-boron-nitride thin films on single-crystal silver. Beyond determining dispersion of optical modes, this technique also enables the direct study of light-matter interactions.

UR - https://www.scopus.com/pages/publications/85136538982

UR - https://www.scopus.com/pages/publications/85136538982#tab=citedBy

M3 - Conference article

AN - SCOPUS:85010651537

SN - 2162-2701

JO - Optics InfoBase Conference Papers

JF - Optics InfoBase Conference Papers

M1 - SW1R.2

T2 - CLEO: Science and Innovations, SI 2016

Y2 - 5 June 2016 through 10 June 2016

ER -

Optical characterization of van der Waals materials via near-field microscopy

Abstract

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