One-dimensional gradient-index metrology based on ray slope measurements using a bootstrap algorithm

Di Lin, James R. Leger, Mint Kunkel, Peter McCarthy

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

The refractive index profile of one-dimensional gradient-index (GRIN) samples can be measured using the incident and exit beam angles of multiple beams passing through the sample at different positions along the index gradient. Beginning from a region of known refractive index, the collective angular deflection measurement of multiple beams is bootstrapped to compute the index profile of the entire sample. An alternative method using an approximate beam displacement model and a corrective algorithm is also presented. The two techniques are used to measure the index profile of a thick GRIN sample, and experimental results show good agreement with a maximum discrepancy of 1.5 × 10-3 in the calculated index. An index accuracy of 5 × 10-4 is predicted for the bootstrap method employing typical micron-level spatial measurements.

Original languageEnglish (US)
Article number112108
JournalOptical Engineering
Volume52
Issue number11
DOIs
StatePublished - Nov 1 2013

Keywords

  • deflectometry
  • geometric optics
  • gradient index
  • metrology

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