On the efficacy of NBTI mitigation techniques

Tuck Boon Chan, John Sartori, Puneet Gupta, Rakesh Kumar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

31 Scopus citations

Abstract

Negative Bias Temperature Instability (NBTI) has become an important reliability issue in modern semiconductor processes. Recent work has attempted to address NBTI-induced degradation at the architecture level. However, such work has relied on device-level analytical models that, we argue, are limited in their flexibility to model the impact of architecture-level techniques on NBTI degradation. In this paper, we propose a flexible numerical model for NBTI degradation that can be adapted to better estimate the impact of architecture-level techniques on NBTI degradation. Our model is a numerical solution to the reaction-diffusion equations describing NBTI degradation that has been parameterized to model the impact of dynamic voltage scaling, averaging effects across logic paths, power gating, and activity management We use this model to understand the effectiveness of different classes of architecture-level techniques that have been proposed to mitigate the effects of NBTI. We show that the potential benefits from these techniques are, for the most part, smaller than what has been previously suggested, and that guardbanding may still be an efficient way to deal with aging.

Original languageEnglish (US)
Title of host publicationProceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2011
Pages932-937
Number of pages6
StatePublished - May 31 2011
Event14th Design, Automation and Test in Europe Conference and Exhibition, DATE 2011 - Grenoble, France
Duration: Mar 14 2011Mar 18 2011

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Other

Other14th Design, Automation and Test in Europe Conference and Exhibition, DATE 2011
CountryFrance
CityGrenoble
Period3/14/113/18/11

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Chan, T. B., Sartori, J., Gupta, P., & Kumar, R. (2011). On the efficacy of NBTI mitigation techniques. In Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2011 (pp. 932-937). [5763151] (Proceedings -Design, Automation and Test in Europe, DATE).