On-chip silicon odometers for circuit aging characterization

Keyphrases

• Circuit Aging 100%
• On chip 100%
• Aging Characterization 100%
• Transistor 50%
• Reliability Monitor 50%
• Aging Effect 50%
• Robust Circuits 50%
• Reliability Model 50%
• Aging Mechanism 50%
• Device Failure 50%
• Bias Temperature Instability 50%
• Chip Reliability 50%
• Process Change 50%
• Device Sizing 50%
• Efficient Technology 50%
• Circuit Failure 50%
• High-k Metal Gate 50%
• Metal Gate Stack 50%
• CMOS Transistor 50%
• Shrinking Device 50%
• Real-time Adjustment 50%
• Shift-or 50%
• Voltage Margin 50%
• Shift Error 50%
• Performance Failure 50%
• Technology Characterization 50%
• Aging Compensation 50%

Engineering

• Change Process 100%
• Gate Stack 100%
• Aging Effect 100%
• Robust Design 100%
• Metal Gate 100%

Computer Science

• Reliability Monitor 100%