Obtaining Structural Parameters from STEM–EDX Maps of Core/Shell Nanocrystals for Optoelectronics

Jacob T. Held, Katharine I. Hunter, Nabeel Dahod, Benjamin Greenberg, Danielle Reifsnyder Hickey, William A. Tisdale, Uwe Kortshagen, K. Andre Mkhoyan

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)989-996
JournalACS Applied Nano Materials
Volume1
Issue number2
DOIs
StatePublished - Feb 23 2018

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Obtaining Structural Parameters from STEM–EDX Maps of Core/Shell Nanocrystals for Optoelectronics. / Held, Jacob T.; Hunter, Katharine I.; Dahod, Nabeel; Greenberg, Benjamin; Reifsnyder Hickey, Danielle; Tisdale, William A.; Kortshagen, Uwe; Mkhoyan, K. Andre.

In: ACS Applied Nano Materials, Vol. 1, No. 2, 23.02.2018, p. 989-996.

Research output: Contribution to journalArticle

Held JT, Hunter KI, Dahod N, Greenberg B, Reifsnyder Hickey D, Tisdale WA et al. Obtaining Structural Parameters from STEM–EDX Maps of Core/Shell Nanocrystals for Optoelectronics. ACS Applied Nano Materials. 2018 Feb 23;1(2):989-996. https://doi.org/10.1021/acsanm.7b00398
Held, Jacob T. ; Hunter, Katharine I. ; Dahod, Nabeel ; Greenberg, Benjamin ; Reifsnyder Hickey, Danielle ; Tisdale, William A. ; Kortshagen, Uwe ; Mkhoyan, K. Andre. / Obtaining Structural Parameters from STEM–EDX Maps of Core/Shell Nanocrystals for Optoelectronics. In: ACS Applied Nano Materials. 2018 ; Vol. 1, No. 2. pp. 989-996.
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