TY - GEN
T1 - Observer based imaging methods for atomic force microscopy
AU - Sahoo, Deepak R.
AU - De, Tathagata
AU - Salapaka, Murti V.
PY - 2005
Y1 - 2005
N2 - In atomic force microscopy, bandwidth or resolution can be affected by active quality factor (Q) control. However, in existing methods the trade off between resolution and bandwidth remains inherent. Observer based Q control method provides greater flexibility in managing the tradeoff between resolution and bandwidth during imaging. It also facilitates theoretical analysis lacking in existing methods. Steady state signals like amplitude and phase are slowly varying variables that are suited to image low bandwidth content of the actual sample profile. Observer based transient imaging scheme with Q control has the promise of detecting high bandwidth content of the sample features during scanning. Transient detection also has the advantage of high sensitivity to small features.
AB - In atomic force microscopy, bandwidth or resolution can be affected by active quality factor (Q) control. However, in existing methods the trade off between resolution and bandwidth remains inherent. Observer based Q control method provides greater flexibility in managing the tradeoff between resolution and bandwidth during imaging. It also facilitates theoretical analysis lacking in existing methods. Steady state signals like amplitude and phase are slowly varying variables that are suited to image low bandwidth content of the actual sample profile. Observer based transient imaging scheme with Q control has the promise of detecting high bandwidth content of the sample features during scanning. Transient detection also has the advantage of high sensitivity to small features.
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U2 - 10.1109/CDC.2005.1582319
DO - 10.1109/CDC.2005.1582319
M3 - Conference contribution
AN - SCOPUS:33847205755
SN - 0780395689
SN - 9780780395688
T3 - Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
SP - 1185
EP - 1190
BT - Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
T2 - 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
Y2 - 12 December 2005 through 15 December 2005
ER -