Observer based imaging methods for atomic force microscopy

Deepak R. Sahoo, Tathagata De, Murti V. Salapaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

25 Scopus citations

Abstract

In atomic force microscopy, bandwidth or resolution can be affected by active quality factor (Q) control. However, in existing methods the trade off between resolution and bandwidth remains inherent. Observer based Q control method provides greater flexibility in managing the tradeoff between resolution and bandwidth during imaging. It also facilitates theoretical analysis lacking in existing methods. Steady state signals like amplitude and phase are slowly varying variables that are suited to image low bandwidth content of the actual sample profile. Observer based transient imaging scheme with Q control has the promise of detecting high bandwidth content of the sample features during scanning. Transient detection also has the advantage of high sensitivity to small features.

Original languageEnglish (US)
Title of host publicationProceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
Pages1185-1190
Number of pages6
DOIs
StatePublished - Dec 1 2005
Event44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05 - Seville, Spain
Duration: Dec 12 2005Dec 15 2005

Publication series

NameProceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
Volume2005

Other

Other44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
CountrySpain
CitySeville
Period12/12/0512/15/05

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