Observer based imaging methods for atomic force microscopy

Deepak R. Sahoo; Tathagata De; Murti V. Salapaka

doi:10.1109/CDC.2005.1582319

Observer based imaging methods for atomic force microscopy

Deepak R. Sahoo, Tathagata De, Murti V. Salapaka

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

25 Scopus citations

Abstract

In atomic force microscopy, bandwidth or resolution can be affected by active quality factor (Q) control. However, in existing methods the trade off between resolution and bandwidth remains inherent. Observer based Q control method provides greater flexibility in managing the tradeoff between resolution and bandwidth during imaging. It also facilitates theoretical analysis lacking in existing methods. Steady state signals like amplitude and phase are slowly varying variables that are suited to image low bandwidth content of the actual sample profile. Observer based transient imaging scheme with Q control has the promise of detecting high bandwidth content of the sample features during scanning. Transient detection also has the advantage of high sensitivity to small features.

Original language	English (US)
Title of host publication	Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
Pages	1185-1190
Number of pages	6
DOIs	https://doi.org/10.1109/CDC.2005.1582319
State	Published - Dec 1 2005
Event	44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05 - Seville, Spain Duration: Dec 12 2005 → Dec 15 2005

Publication series

Name	Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
Volume	2005

Other

Other	44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
Country	Spain
City	Seville
Period	12/12/05 → 12/15/05

Access

10.1109/CDC.2005.1582319

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Sahoo, D. R., De, T., & Salapaka, M. V. (2005). Observer based imaging methods for atomic force microscopy. In Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05 (pp. 1185-1190). [1582319] (Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05; Vol. 2005). https://doi.org/10.1109/CDC.2005.1582319

Observer based imaging methods for atomic force microscopy. / Sahoo, Deepak R.; De, Tathagata; Salapaka, Murti V.

Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05. 2005. p. 1185-1190 1582319 (Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05; Vol. 2005).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Sahoo, DR, De, T & Salapaka, MV 2005, Observer based imaging methods for atomic force microscopy. in Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05., 1582319, Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05, vol. 2005, pp. 1185-1190, 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05, Seville, Spain, 12/12/05. https://doi.org/10.1109/CDC.2005.1582319

Sahoo DR, De T, Salapaka MV. Observer based imaging methods for atomic force microscopy. In Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05. 2005. p. 1185-1190. 1582319. (Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05). https://doi.org/10.1109/CDC.2005.1582319

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