Numerical and experimental investigation of nanosecond-pulsed plasma activated C2H4/O2/Ar mixtures in a low temperature flow reactor

Suo Yang, Sharath Nagaraja, Vigor Yang, Wenting Sun, Joseph K. Lefkowitz, Yiguang Ju

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations


The present work combines numerical and experimental efforts together to investigate the effect of low temperature, nano-second pulsed plasma discharges on the oxidation of C2H4/O2/Ar mixtures at 60 Torr pressure. The non-equilibrium plasma discharge is modeled by a two-temperature framework with detailed chemistry-plasma mechanism. The model shows that 75%~77% of input pulse energy was consumed in electron impact dissociation, excitation and ionization reactions, which efficiently produces significant amount of important radical species, fuel fragments and several excited species. The trends of numerical and experimental results agree well. The results from 1D model are compared with 0D model and it show that 1D model in general agrees better with experiments than 0D model. The modeling results reveal that reactions between O(1D) and hydrocarbons are importantly affecting the formation of C2H6, CH2CO, CH2O, CO, CO2, H2O2, H2O, O21Δg) and O2(b1Σ+g). Due to the persistent relatively high level of O21Δg) and O2(b1Σ+g), C2H2 converts into HCO directly without the need of going through the intermediate species of HCCO, CH2* and CH2 in the case without plasma. Owing to the long lifetime of O21Δg), this effect can last to 3.1 sec after the finish of all 150 pulses.

Original languageEnglish (US)
Title of host publication53rd AIAA Aerospace Sciences Meeting
PublisherAmerican Institute of Aeronautics and Astronautics Inc, AIAA
ISBN (Print)9781624103438
StatePublished - 2015
Externally publishedYes
Event53rd AIAA Aerospace Sciences Meeting, 2015 - Kissimmee, United States
Duration: Jan 5 2015Jan 9 2015

Publication series

Name53rd AIAA Aerospace Sciences Meeting


Other53rd AIAA Aerospace Sciences Meeting, 2015
Country/TerritoryUnited States

Bibliographical note

Publisher Copyright:
© 2015 by the American Institute of Aeronautics and Astronautics, Inc.


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