A Novel Approach to Combine Scanning Electrochemical Microscopy and Scanning Photoelectrochemical Microscopy

Norberto Casillas, Patrick James, William H. Smyrl’

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66 Scopus citations

Abstract

A new instrumental technique that combines scanning electrochemical microscopy and scanning photoelectrochemical microscopy is described. This technique is capable of monitoring electroassisted and/or photoassisted reactions on semiconductor surfaces either concurrently or sequentially. The instrument uses a probe which consists of an optical fiber coated with gold and isolated from its surrounding environment with a polymer film. Measurements of the electroreduction of Br2 at the gold ring which had been generated by photo-oxidation of Br-on a 50 A thick TiO2film on Ti are discussed.

Original languageEnglish (US)
Pages (from-to)L16-L18
JournalJournal of the Electrochemical Society
Volume142
Issue number1
DOIs
StatePublished - Jan 1 1995

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