Note: Design of FPGA based system identification module with application to atomic force microscopy

Sayan Ghosal, Sourav Pradhan, Murti Salapaka

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The science of system identification is widely utilized in modeling input-output relationships of diverse systems. In this article, we report field programmable gate array (FPGA) based implementation of a real-time system identification algorithm which employs forgetting factors and bias compensation techniques. The FPGA module is employed to estimate the mechanical properties of surfaces of materials at the nano-scale with an atomic force microscope (AFM). The FPGA module is user friendly which can be interfaced with commercially available AFMs. Extensive simulation and experimental results validate the design.

Original languageEnglish (US)
Article number056103
JournalReview of Scientific Instruments
Volume89
Issue number5
DOIs
StatePublished - May 1 2018

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