TY - GEN
T1 - Norm Optimal Iterative Learning Control for a Roll to Roll nano/micro-manufacturing system
AU - Sutanto, Erick
AU - Alleyne, Andrew G.
PY - 2013
Y1 - 2013
N2 - Recent advances in micro/nano-scale manufacturing have transitioned from batch modes of fabrication on rigid substrates to continuous modes of fabrication on flexible substrates. The majority of these continuous systems utilize a Roll to Roll (R2R) system approach. To maximize the effectiveness of the R2R system it is important to maintain high precision motion and tension control. For micro/nano-manufacturing the continuous substrate is often processed using both stepping motions and continuous scanning motions. In this work, a Norm Optimal Iterative Learning Controller (NOILC) is utilized to simultaneously improve the position tracking precision, as well as the web tension regulation. The approach is demonstrated on an experimental testbed for both continuous and stepping trajectories with greatly improved performance compared to H2 optimal feedback.
AB - Recent advances in micro/nano-scale manufacturing have transitioned from batch modes of fabrication on rigid substrates to continuous modes of fabrication on flexible substrates. The majority of these continuous systems utilize a Roll to Roll (R2R) system approach. To maximize the effectiveness of the R2R system it is important to maintain high precision motion and tension control. For micro/nano-manufacturing the continuous substrate is often processed using both stepping motions and continuous scanning motions. In this work, a Norm Optimal Iterative Learning Controller (NOILC) is utilized to simultaneously improve the position tracking precision, as well as the web tension regulation. The approach is demonstrated on an experimental testbed for both continuous and stepping trajectories with greatly improved performance compared to H2 optimal feedback.
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U2 - 10.1109/acc.2013.6580769
DO - 10.1109/acc.2013.6580769
M3 - Conference contribution
AN - SCOPUS:84883527185
SN - 9781479901777
T3 - Proceedings of the American Control Conference
SP - 5935
EP - 5941
BT - 2013 American Control Conference, ACC 2013
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2013 1st American Control Conference, ACC 2013
Y2 - 17 June 2013 through 19 June 2013
ER -
