Abstract
A study was performed on the nonuniformities in GaN/AlN quantum wells. The composition sensitive annular dark field imaging and electron energy-loss spectroscopy were used to determine long-range uniformities of GaN quantum wells. The results indicated that the interfaces between the quantum wells and the barriers are in most cases almost atomically sharp.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2668-2670 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 83 |
| Issue number | 13 |
| DOIs | |
| State | Published - Sep 29 2003 |
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