Abstract
Synchrotron-radiation photoemission studies of heterovalent heterojunctions involving Ge and Cd1-xMnxTe alloys (x=0, 0.35, and 0.60) were performed on interfaces prepared in situ by Ge deposition on cleaved (110) semimagnetic semiconductor surfaces. The valence-band offsets ΔEv were obtained with consistent results through a nonlinear least-squares fit of the interface valence-band emission in terms of a superposition of valence-band spectra for the individual semiconductors, and with a more conventional method utilizing the Te 4d and Ge 3d core-level emission. We find valence-band offsets ΔEv=0.80-0.83 eV largely independent of semimagnetic composition and band gap. In the framework of the linear models of semiconductor heterojunction behavior, this result would indicate that CdTe-Cd1-xMnxTe heterojunctions will follow the common anion rule.
Original language | English (US) |
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Pages (from-to) | 4545-4551 |
Number of pages | 7 |
Journal | Physical Review B |
Volume | 48 |
Issue number | 7 |
DOIs | |
State | Published - 1993 |