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Noise in Various Electron Multiplication Methods used in Imaging Devices
Gerald W Timm, Aldert Van Der Ziel
Urology
Research output
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Contribution to journal
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Article
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peer-review
4
Scopus citations
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Keyphrases
Imaging Device
100%
Deterioration Factor
100%
Electron multiplication
100%
Multiplier Technique
100%
Primary Energy
66%
Frequency Dependence
33%
Input Noise
33%
Output Noise
33%
Electron Loss
33%
Image Intensifier
33%
Universal Function
33%
Multiplication Factor
33%
Oise
33%
Secondary Emission
33%
Current multiplication
33%
Secondary Electron multiplier
33%
Engineering
Primary Energy
100%
Output Noise
50%
Input Noise
50%
Secondary Electrons
50%
Intensifier
50%
Multiplication Factor
50%
Collector Voltage
50%
Secondary Emission
50%