Neutron-Induced Soft Error Measurements of Rad-Hard DICE Flip-Flops with Shared and Isolated Well Layouts

Junkyu Kim; Robert P Bloom; Yonghyeon Yi; Chris H. Kim; Chulseung Lim; Ilho Jang; Jungho Jin; Yuchul Hwang; Kichul Chun

doi:10.1109/irps61424.2026.11499211

Neutron-Induced Soft Error Measurements of Rad-Hard DICE Flip-Flops with Shared and Isolated Well Layouts

Junkyu Kim
, Robert P Bloom
, Yonghyeon Yi
, Chris H. Kim
, Chulseung Lim
, Ilho Jang
, Jungho Jin
, Yuchul Hwang
, Kichul Chun

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Dual Interlocked Storage Cell (DICE) flip-flops with isolated well structures were experimentally evaluated under neutron irradiation. Each design implements radiation hardening by layout techniques through spatial separation of transistors storing equivalent logic nodes into vertically separated wells to minimize charge sharing. Neutron beam testing of 28nm isolated well DICE designs confirms an order of magnitude lower upset rates compared to standard DICE flip-flops.

Original language	English (US)
Title of host publication	2026 IEEE International Reliability Physics Symposium, IRPS 2026
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9798331589714
DOIs	https://doi.org/10.1109/irps61424.2026.11499211
State	Published - 2026
Event	2026 IEEE International Reliability Physics Symposium, IRPS 2026 - Tucson, United States Duration: Mar 22 2026 → Mar 26 2026

Publication series

Name	IEEE International Reliability Physics Symposium Proceedings
ISSN (Print)	1541-7026

Conference

Conference	2026 IEEE International Reliability Physics Symposium, IRPS 2026
Country/Territory	United States
City	Tucson
Period	3/22/26 → 3/26/26

Bibliographical note

Publisher Copyright:
© 2026 IEEE.

Keywords

DICE flip-flops
layout techniques
separated wells
single-event upsets

Publisher link

10.1109/irps61424.2026.11499211

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Kim, J., Bloom, R. P., Yi, Y., Kim, C. H., Lim, C., Jang, I., Jin, J., Hwang, Y., & Chun, K. (2026). Neutron-Induced Soft Error Measurements of Rad-Hard DICE Flip-Flops with Shared and Isolated Well Layouts. In 2026 IEEE International Reliability Physics Symposium, IRPS 2026 (IEEE International Reliability Physics Symposium Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/irps61424.2026.11499211

Neutron-Induced Soft Error Measurements of Rad-Hard DICE Flip-Flops with Shared and Isolated Well Layouts. / Kim, Junkyu; Bloom, Robert P; Yi, Yonghyeon et al.
2026 IEEE International Reliability Physics Symposium, IRPS 2026. Institute of Electrical and Electronics Engineers Inc., 2026. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kim, J, Bloom, RP, Yi, Y, Kim, CH, Lim, C, Jang, I, Jin, J, Hwang, Y & Chun, K 2026, Neutron-Induced Soft Error Measurements of Rad-Hard DICE Flip-Flops with Shared and Isolated Well Layouts. in 2026 IEEE International Reliability Physics Symposium, IRPS 2026. IEEE International Reliability Physics Symposium Proceedings, Institute of Electrical and Electronics Engineers Inc., 2026 IEEE International Reliability Physics Symposium, IRPS 2026, Tucson, United States, 3/22/26. https://doi.org/10.1109/irps61424.2026.11499211

Kim J, Bloom RP, Yi Y, Kim CH, Lim C, Jang I et al. Neutron-Induced Soft Error Measurements of Rad-Hard DICE Flip-Flops with Shared and Isolated Well Layouts. In 2026 IEEE International Reliability Physics Symposium, IRPS 2026. Institute of Electrical and Electronics Engineers Inc. 2026. (IEEE International Reliability Physics Symposium Proceedings). doi: 10.1109/irps61424.2026.11499211

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abstract = "Dual Interlocked Storage Cell (DICE) flip-flops with isolated well structures were experimentally evaluated under neutron irradiation. Each design implements radiation hardening by layout techniques through spatial separation of transistors storing equivalent logic nodes into vertically separated wells to minimize charge sharing. Neutron beam testing of 28nm isolated well DICE designs confirms an order of magnitude lower upset rates compared to standard DICE flip-flops.",

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Neutron-Induced Soft Error Measurements of Rad-Hard DICE Flip-Flops with Shared and Isolated Well Layouts

Abstract

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