Nano-imaging of strain-tuned stripe textures in a Mott crystal

A. S. McLeod, A. Wieteska, G. Chiriaco, B. Foutty, Y. Wang, Y. Yuan, F. Xue, V. Gopalan, L. Q. Chen, Z. Q. Mao, A. J. Millis, A. N. Pasupathy, D. N. Basov

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Material Science