Abstract
An algorithm is proposed which predicts the optimal features of every node in a binary tree procedure. The algorithm estimates the probability of error by approximating the area under the likelihood ratio function for two classes and taking into account the number of training samples used in estimating each of these two classes. Some results on feature selection techniques, particularly in the presence of a very limited set of training samples, are presented. -from NASA Abstract E82-10213
| Original language | English (US) |
|---|---|
| Title of host publication | Unknown Host Publication Title |
| Publisher | Purdue University, Lafayette, IN, Laboratory for Applications of Remote Sensing, LARS-101481 |
| State | Published - 1981 |
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