Multimode and multitone analysis of the dynamic mode operation of the Atomic Force Microscope

Govind Saraswat, Pranav Agarwal, Murti V. Salapaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

This article investigates the multimode model of the cantilever beam during probe based imaging. It develops a framework to quantify the effects of different material properties like dissipativity and stiffness in a near tapping mode operation of Atomic Force Microscope (AFM), which is the primary mode of imaging soft matter, when excitation consists of more than one sinusoids. Averaging theory forms an important basis and provides the theoretical foundations. Effect of dissipative and stiffness properties of the sample on the forces experienced by probe is modeled as changes in parameters of an equivalent linear time invariant model, of the cantilever-sample system. It is shown that this model can be extended to the case when multiple modes of the cantilever participate in the nonlinear interaction with the sample forces.

Original languageEnglish (US)
Title of host publication2013 American Control Conference, ACC 2013
Pages5506-5511
Number of pages6
StatePublished - Sep 11 2013
Event2013 1st American Control Conference, ACC 2013 - Washington, DC, United States
Duration: Jun 17 2013Jun 19 2013

Publication series

NameProceedings of the American Control Conference
ISSN (Print)0743-1619

Other

Other2013 1st American Control Conference, ACC 2013
CountryUnited States
CityWashington, DC
Period6/17/136/19/13

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