Moment reversal characterization of thin magnetic film by VSM or AGFM

Z. S. Shan; Yingfan Xu; J. P. Wang; T. C. Chong; S. S. Malhotra; D. C. Staffort; C. X. Zhu

doi:10.1109/20.951016

Moment reversal characterization of thin magnetic film by VSM or AGFM

Z. S. Shan
, Yingfan Xu
, J. P. Wang
, T. C. Chong
, S. S. Malhotra
, D. C. Staffort
, C. X. Zhu

Electrical and Computer Engineering

Research output: Contribution to journal › Conference article › peer-review

10 Scopus citations

Abstract

An approach has been developed to determine the thermal stability factor (K_uV*/k_BT), switching volume (V*), anisotropy (K_u), and dynamic coercivity (H_C) in one set of "moment-decay measurements." The experimental results for three sets of media films, the CoCrPt: C and CoCrPt: SiO₂ granular films and CoCrTaPt commercial hard disks, are reported. This approach offers faster measurements and reproducible data.

Original language	English (US)
Pages (from-to)	1944-1946
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	37
Issue number	4 I
DOIs	https://doi.org/10.1109/20.951016
State	Published - Jul 2001
Event	8th Joint Magnetism and Magnetic Materials -International Magnetic Conference- (MMM-Intermag) - San Antonio, TX, United States Duration: Jan 7 2001 → Jan 11 2001

Keywords

Anisotropy
Moment-decay
Switching volume
Thermal stability factor

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10.1109/20.951016

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title = "Moment reversal characterization of thin magnetic film by VSM or AGFM",

abstract = "An approach has been developed to determine the thermal stability factor (KuV*/kBT), switching volume (V*), anisotropy (Ku), and dynamic coercivity (HC) in one set of {"}moment-decay measurements.{"} The experimental results for three sets of media films, the CoCrPt: C and CoCrPt: SiO2 granular films and CoCrTaPt commercial hard disks, are reported. This approach offers faster measurements and reproducible data.",

keywords = "Anisotropy, Moment-decay, Switching volume, Thermal stability factor",

author = "Shan, \{Z. S.\} and Yingfan Xu and Wang, \{J. P.\} and Chong, \{T. C.\} and Malhotra, \{S. S.\} and Staffort, \{D. C.\} and Zhu, \{C. X.\}",

year = "2001",

month = jul,

doi = "10.1109/20.951016",

language = "English (US)",

volume = "37",

pages = "1944--1946",

journal = "IEEE Transactions on Magnetics",

issn = "0018-9464",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "4 I",

note = "8th Joint Magnetism and Magnetic Materials -International Magnetic Conference- (MMM-Intermag) ; Conference date: 07-01-2001 Through 11-01-2001",

}

TY - JOUR

T1 - Moment reversal characterization of thin magnetic film by VSM or AGFM

AU - Shan, Z. S.

AU - Xu, Yingfan

AU - Wang, J. P.

AU - Chong, T. C.

AU - Malhotra, S. S.

AU - Staffort, D. C.

AU - Zhu, C. X.

PY - 2001/7

Y1 - 2001/7

N2 - An approach has been developed to determine the thermal stability factor (KuV*/kBT), switching volume (V*), anisotropy (Ku), and dynamic coercivity (HC) in one set of "moment-decay measurements." The experimental results for three sets of media films, the CoCrPt: C and CoCrPt: SiO2 granular films and CoCrTaPt commercial hard disks, are reported. This approach offers faster measurements and reproducible data.

AB - An approach has been developed to determine the thermal stability factor (KuV*/kBT), switching volume (V*), anisotropy (Ku), and dynamic coercivity (HC) in one set of "moment-decay measurements." The experimental results for three sets of media films, the CoCrPt: C and CoCrPt: SiO2 granular films and CoCrTaPt commercial hard disks, are reported. This approach offers faster measurements and reproducible data.

KW - Anisotropy

KW - Moment-decay

KW - Switching volume

KW - Thermal stability factor

UR - https://www.scopus.com/pages/publications/0035385941

UR - https://www.scopus.com/pages/publications/0035385941#tab=citedBy

U2 - 10.1109/20.951016

DO - 10.1109/20.951016

M3 - Conference article

AN - SCOPUS:0035385941

SN - 0018-9464

VL - 37

SP - 1944

EP - 1946

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

IS - 4 I

T2 - 8th Joint Magnetism and Magnetic Materials -International Magnetic Conference- (MMM-Intermag)

Y2 - 7 January 2001 through 11 January 2001

ER -

Moment reversal characterization of thin magnetic film by VSM or AGFM

Abstract

Keywords

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