Moment reversal characterization of thin magnetic film by VSM or AGFM

Z. S. Shan, Yingfan Xu, J. P. Wang, T. C. Chong, S. S. Malhotra, D. C. Staffort, C. X. Zhu

Research output: Contribution to journalConference articlepeer-review

10 Scopus citations

Abstract

An approach has been developed to determine the thermal stability factor (KuV*/kBT), switching volume (V*), anisotropy (Ku), and dynamic coercivity (HC) in one set of "moment-decay measurements." The experimental results for three sets of media films, the CoCrPt: C and CoCrPt: SiO2 granular films and CoCrTaPt commercial hard disks, are reported. This approach offers faster measurements and reproducible data.

Original languageEnglish (US)
Pages (from-to)1944-1946
Number of pages3
JournalIEEE Transactions on Magnetics
Volume37
Issue number4 I
DOIs
StatePublished - Jul 2001
Event8th Joint Magnetism and Magnetic Materials -International Magnetic Conference- (MMM-Intermag) - San Antonio, TX, United States
Duration: Jan 7 2001Jan 11 2001

Keywords

  • Anisotropy
  • Moment-decay
  • Switching volume
  • Thermal stability factor

Fingerprint

Dive into the research topics of 'Moment reversal characterization of thin magnetic film by VSM or AGFM'. Together they form a unique fingerprint.

Cite this