Modulation imaging in reflection-mode near-field scanning optical microscopy

Josef Kerimo; Markus Büchler; William H. Smyrl

doi:10.1016/S0304-3991(00)00030-9

Modulation imaging in reflection-mode near-field scanning optical microscopy

Josef Kerimo, Markus Büchler, William H. Smyrl

Chemical Engineering and Materials Science

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

A simple implementation of modulation of the near-field optical signal of near-field probes based on the shear-force feedback system is demonstrated in a reflection-mode near-field optical microscope. The modulation exhibits a derivative type of dependence on the near-field signal and no sensitivity to topography. It is shown that the modulation image can be calculated directly from the derivative of the conventional near-field scattering image. This type of near-field modulation is an excellent way to reject far-field artifacts from the near-field signal. Copyright (C) 2000 Elsevier Science B.V.

Original language	English (US)
Pages (from-to)	127-131
Number of pages	5
Journal	Ultramicroscopy
Volume	84
Issue number	3-4
DOIs	https://doi.org/10.1016/S0304-3991(00)00030-9
State	Published - Aug 2000

Bibliographical note

Funding Information:
This work has been supported by NSF/DMR-9816404 and by Seagate Recording Heads. Francis Guillaume carried out the confocal imaging of the samples.

Keywords

Derivative image
NSOM
Near field modulation

Publisher link

10.1016/S0304-3991(00)00030-9

Find It

Find It at U of M Libraries

Cite this

@article{2693801cc6ff46728a33ad3597c951a6,

title = "Modulation imaging in reflection-mode near-field scanning optical microscopy",

abstract = "A simple implementation of modulation of the near-field optical signal of near-field probes based on the shear-force feedback system is demonstrated in a reflection-mode near-field optical microscope. The modulation exhibits a derivative type of dependence on the near-field signal and no sensitivity to topography. It is shown that the modulation image can be calculated directly from the derivative of the conventional near-field scattering image. This type of near-field modulation is an excellent way to reject far-field artifacts from the near-field signal. Copyright (C) 2000 Elsevier Science B.V.",

keywords = "Derivative image, NSOM, Near field modulation",

author = "Josef Kerimo and Markus B{\"u}chler and Smyrl, {William H.}",

note = "Funding Information: This work has been supported by NSF/DMR-9816404 and by Seagate Recording Heads. Francis Guillaume carried out the confocal imaging of the samples.",

year = "2000",

month = aug,

doi = "10.1016/S0304-3991(00)00030-9",

language = "English (US)",

volume = "84",

pages = "127--131",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier B.V.",

number = "3-4",

}

TY - JOUR

T1 - Modulation imaging in reflection-mode near-field scanning optical microscopy

AU - Kerimo, Josef

AU - Büchler, Markus

AU - Smyrl, William H.

N1 - Funding Information: This work has been supported by NSF/DMR-9816404 and by Seagate Recording Heads. Francis Guillaume carried out the confocal imaging of the samples.

PY - 2000/8

Y1 - 2000/8

N2 - A simple implementation of modulation of the near-field optical signal of near-field probes based on the shear-force feedback system is demonstrated in a reflection-mode near-field optical microscope. The modulation exhibits a derivative type of dependence on the near-field signal and no sensitivity to topography. It is shown that the modulation image can be calculated directly from the derivative of the conventional near-field scattering image. This type of near-field modulation is an excellent way to reject far-field artifacts from the near-field signal. Copyright (C) 2000 Elsevier Science B.V.

AB - A simple implementation of modulation of the near-field optical signal of near-field probes based on the shear-force feedback system is demonstrated in a reflection-mode near-field optical microscope. The modulation exhibits a derivative type of dependence on the near-field signal and no sensitivity to topography. It is shown that the modulation image can be calculated directly from the derivative of the conventional near-field scattering image. This type of near-field modulation is an excellent way to reject far-field artifacts from the near-field signal. Copyright (C) 2000 Elsevier Science B.V.

KW - Derivative image

KW - NSOM

KW - Near field modulation

UR - http://www.scopus.com/inward/record.url?scp=0343526430&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0343526430&partnerID=8YFLogxK

U2 - 10.1016/S0304-3991(00)00030-9

DO - 10.1016/S0304-3991(00)00030-9

M3 - Article

AN - SCOPUS:0343526430

SN - 0304-3991

VL - 84

SP - 127

EP - 131

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 3-4

ER -

Modulation imaging in reflection-mode near-field scanning optical microscopy

Abstract

Bibliographical note

Keywords

Publisher link

Find It

Other files and links

Fingerprint

Cite this