Modulation imaging in reflection-mode near-field scanning optical microscopy

Josef Kerimo, Markus Büchler, William H. Smyrl

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

A simple implementation of modulation of the near-field optical signal of near-field probes based on the shear-force feedback system is demonstrated in a reflection-mode near-field optical microscope. The modulation exhibits a derivative type of dependence on the near-field signal and no sensitivity to topography. It is shown that the modulation image can be calculated directly from the derivative of the conventional near-field scattering image. This type of near-field modulation is an excellent way to reject far-field artifacts from the near-field signal. Copyright (C) 2000 Elsevier Science B.V.

Original languageEnglish (US)
Pages (from-to)127-131
Number of pages5
JournalUltramicroscopy
Volume84
Issue number3-4
DOIs
StatePublished - Aug 1 2000

Keywords

  • Derivative image
  • NSOM
  • Near field modulation

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