Abstract
For EM lifetime estimation, we use the well-known Black’s equation (Black 1969) developed by the physicist J.R. Black at the end of the 1960s.
Original language | English (US) |
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Title of host publication | Electromigration Inside Logic Cells |
Subtitle of host publication | Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS |
Publisher | Springer International Publishing |
Pages | 33-43 |
Number of pages | 11 |
ISBN (Electronic) | 9783319488998 |
ISBN (Print) | 9783319488981 |
DOIs | |
State | Published - Jan 1 2016 |
Bibliographical note
Publisher Copyright:© Springer International Publishing AG 2017.