Modeling and analysis of leakage induced damping effect in low voltage LSIs

Gu Jie, John Keane, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Fingerprint

Dive into the research topics of 'Modeling and analysis of leakage induced damping effect in low voltage LSIs'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science

Physics