MMM: Machine Learning-Based Macro-Modeling for Linear Analog ICs and ADC/DACs

Yishuang Lin, Yaguang Li, Meghna Madhusudan, Sachin S. Sapatnekar, Ramesh Harjani, Jiang Hu

    Research output: Contribution to journalArticlepeer-review

    2 Scopus citations

    Abstract

    Performance modeling is a key bottleneck for analog design automation. Although machine learning-based models have advanced the state-of-the-art, they have so far suffered from huge data preparation cost, very limited reusability, and inadequate accuracy for large circuits. We introduce ML-based macro-modeling techniques to mitigate these problems for linear analog ICs and ADC/DACs. The modeling techniques are based on macro-models, which can be assembled to evaluate circuit system performance, and more appealingly can be reused across different circuit topologies. On representative testcases, our method achieves more than 1700× speedup for data preparation and remarkably smaller model errors compared to recent ML approaches. It also attains 3600× acceleration over SPICE simulation with very small errors and reduces data preparation time for an ADC design from 40 days to 9.6 h.

    Original languageEnglish (US)
    Pages (from-to)4740-4752
    Number of pages13
    JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
    Volume43
    Issue number12
    DOIs
    StatePublished - 2024

    Bibliographical note

    Publisher Copyright:
    © 1982-2012 IEEE.

    Keywords

    • Electronic design automation
    • machine learning
    • macro modeling
    • performance modeling

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