Mitigation of NBTI induced performance degradation in on-chip digital LDOs

Keyphrases

• On chip 100%
• Performance Degradation 100%
• Digital Dropout 100%
• Output-capacitorless Low-dropout Regulator (OCL-LDO) 100%
• Shift Register 66%
• Change of Direction 66%
• Controller 33%
• Design Considerations 33%
• Performance Improvement 33%
• Loading Conditions 33%
• Mobile Devices 33%
• Proposed Design 33%
• Microprocessor 33%
• Area Overhead 33%
• Easy Integration 33%
• Register-based 33%
• Electrical Stress 33%
• Voltage Regulator 33%
• Benchmark Applications 33%
• Reliability-based Design 33%
• Arbitrary Loading 33%
• NBTI Effect 33%
• IBM POWER8 33%
• Energy Overhead 33%
• Fast Response Speed 33%

Computer Science

• Shift Register 100%
• Performance Degradation 100%
• Mobile Device 50%
• Application Benchmark 50%
• Type Voltage Regulator 50%
• Performance Improvement 50%
• Microprocessor 50%

Engineering

• Performance Degradation 100%
• Voltage Regulator 100%
• Shift Register 50%
• Design Consideration 25%
• Performance Improvement 25%
• Load Condition 25%
• Fast Response 25%
• Area Overhead 25%
• Microprocessor 25%
• Can Controller 25%