Mitigation of NBTI induced performance degradation in on-chip digital LDOs

Longfei Wang, S. Karen Khatamifard, Ulya R. Karpuzcu, Selçuk Köse

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Abstract

On-chip digital low-dropout voltage regulators (LDOs) have recently gained impetus and drawn significant attention for integration within both mobile devices and micro-processors. Although the benefits of easy integration and fast response speed surpass analog LDOs and other voltage regulator types, NBTI induced performance degradation is typically overlooked. The conventional bi-directional shift register based controller can even exacerbate the degradation, which has been demonstrated theoretically and through practical applications. In this paper, a novel uni-directional shift register is proposed to evenly distribute the electrical stress and mitigate the NBTI effects under arbitrary load conditions with nearly no extra power and area overhead. The benefits of the proposed design as well as reliability aware design considerations are explored and highlighted through simulation of an IBM POWER8 like processor under several benchmark applications. It is demonstrated that the proposed NBTI-aware design can achieve up to 43.2% performance improvement as compared to a conventional one.

Original languageEnglish (US)
Title of host publicationProceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages803-808
Number of pages6
ISBN (Electronic)9783981926316
DOIs
StatePublished - Apr 19 2018
Event2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018 - Dresden, Germany
Duration: Mar 19 2018Mar 23 2018

Publication series

NameProceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
Volume2018-January

Other

Other2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
CountryGermany
CityDresden
Period3/19/183/23/18

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Wang, L., Khatamifard, S. K., Karpuzcu, U. R., & Köse, S. (2018). Mitigation of NBTI induced performance degradation in on-chip digital LDOs. In Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018 (pp. 803-808). (Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018; Vol. 2018-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/DATE.2018.8342116