Microstructure and magnetic properties of CoZr thin film

Xiao Feng Yao; Jian Ping Wang; Tie Jun Zhou; Tow C. Chong

doi:10.1063/1.1556273

Microstructure and magnetic properties of CoZr thin film

Xiao Feng Yao, Jian Ping Wang, Tie Jun Zhou, Tow C. Chong

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

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Abstract

The microstructure and magnetic properties of CoZr thin films were analyzed. It was found that a change in magnetic phase occurs by annealing the as-deposited films at temperatures of above 550°C for 2 h. All the annealed films were observed to show perpendicular magnetic anisotropy.

Original language	English (US)
Pages (from-to)	8310-8312
Number of pages	3
Journal	Journal of Applied Physics
Volume	93
Issue number	10 3
DOIs	https://doi.org/10.1063/1.1556273
State	Published - May 15 2003

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Copyright 2008 Elsevier B.V., All rights reserved.

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title = "Microstructure and magnetic properties of CoZr thin film",

abstract = "The microstructure and magnetic properties of CoZr thin films were analyzed. It was found that a change in magnetic phase occurs by annealing the as-deposited films at temperatures of above 550°C for 2 h. All the annealed films were observed to show perpendicular magnetic anisotropy.",

author = "Yao, \{Xiao Feng\} and Wang, \{Jian Ping\} and Zhou, \{Tie Jun\} and Chong, \{Tow C.\}",

year = "2003",

month = may,

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doi = "10.1063/1.1556273",

language = "English (US)",

volume = "93",

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journal = "Journal of Applied Physics",

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publisher = "American Institute of Physics",

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T1 - Microstructure and magnetic properties of CoZr thin film

AU - Yao, Xiao Feng

AU - Wang, Jian Ping

AU - Zhou, Tie Jun

AU - Chong, Tow C.

PY - 2003/5/15

Y1 - 2003/5/15

N2 - The microstructure and magnetic properties of CoZr thin films were analyzed. It was found that a change in magnetic phase occurs by annealing the as-deposited films at temperatures of above 550°C for 2 h. All the annealed films were observed to show perpendicular magnetic anisotropy.

AB - The microstructure and magnetic properties of CoZr thin films were analyzed. It was found that a change in magnetic phase occurs by annealing the as-deposited films at temperatures of above 550°C for 2 h. All the annealed films were observed to show perpendicular magnetic anisotropy.

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DO - 10.1063/1.1556273

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EP - 8312

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 10 3

ER -

Microstructure and magnetic properties of CoZr thin film

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