Keyphrases
Abrupt Interface
20%
Bilayered Structure
20%
Chemical Vapor Deposition
100%
Dark-field Imaging
20%
Diffraction Microscopy
20%
Electron Microscopy
20%
Epitaxial
20%
GaN Buffer
20%
GaN Template
20%
High-angle Annular Dark Field (HAADF)
20%
In Content
20%
In-rich
40%
Indium Gallium Nitride (InGaN)
100%
InGaN Layer
20%
Metal-organic Chemical Vapor Deposition (MOCVD)
20%
Microstructural Investigation
100%
Sapphire Substrate
20%
Threading Dislocation
20%
Engineering
Buffer Layer
50%
Chemical Vapor Deposition
100%
Field Image
50%
Ray Diffraction
50%
Sapphire Substrate
50%
Threading Dislocation
50%
Vapor Deposition
100%
Medicine and Dentistry
Buffer
100%
DNA Template
100%
Electron Microscopy
100%
X Ray Diffraction
100%
Material Science
Buffer Layer
50%
Chemical Vapor Deposition
100%
Electron Microscopy
50%
Nucleation
50%
Sapphire
50%