Microstructural characterization of an oriented silicalite film

M. C. Lovallo, M. Tsapatsis

Research output: Contribution to journalConference articlepeer-review

Abstract

The crystal orientation of a submicron silicalite membrane is examined using standard x-ray diffraction and pole-figure analyses. Results indicate that the crystals in the molecular sieving layer are preferentially oriented with both straight and sinusoidal channel networks of the zeolite parallel to the membrane surface. This requires that transport across the membrane proceed down the c-axis of the crystals which can occur by jumping between the two channel networks. EDAX data confirms that the molecular sieving layer is the pure silica zeolite silicalite.

Original languageEnglish (US)
Pages (from-to)161-166
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume454
StatePublished - Dec 1 1997
EventProceedings of the 1996 MRS Fall Symposium - Boston, MA, USA
Duration: Dec 2 1996Dec 6 1996

Fingerprint Dive into the research topics of 'Microstructural characterization of an oriented silicalite film'. Together they form a unique fingerprint.

Cite this