Microheater multilayer interference to reduce thermal emission for low photon number luminescence measurement

P. R. Armstrong; Merlin L Mah; K. D. Olson; Joseph J Talghader

doi:10.1109/TRANSDUCERS.2015.7181075

Microheater multilayer interference to reduce thermal emission for low photon number luminescence measurement

P. R. Armstrong, Merlin L Mah, K. D. Olson, Joseph J Talghader

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

Under low light conditions, high temperature measurements of luminescence are limited by the overlap of the thermal emission spectra and the luminescent emission spectra being measured. A solution to this is to have a heat source that can be designed not to emit in a certain wavelength range(s) by coating it with an interference multilayer. The multilayer effectively changes the emissivity of the heat source. Microheaters made from aluminum oxide platforms with platinum heating elements were coated with aluminum oxide and titanium oxide multilayers. This multilayer structure was used to measure the thermoluminescence of CaSO₄:Ce,Tb up to 420°C. They also showed a thermal emission background 800 times lower at 600°C than the same microheater with no multilayer structure.

Original language	English (US)
Title of host publication	2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	924-927
Number of pages	4
ISBN (Electronic)	9781479989553
DOIs	https://doi.org/10.1109/TRANSDUCERS.2015.7181075
State	Published - Aug 5 2015
Event	18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015 - Anchorage, United States Duration: Jun 21 2015 → Jun 25 2015

Publication series

Name	2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015

Other

Other	18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015
Country/Territory	United States
City	Anchorage
Period	6/21/15 → 6/25/15

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

Keywords

microheaters
optical coatings
thermoluminescence

Publisher link

10.1109/TRANSDUCERS.2015.7181075

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Armstrong, P. R., Mah, M. L., Olson, K. D., & Talghader, J. J. (2015). Microheater multilayer interference to reduce thermal emission for low photon number luminescence measurement. In 2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015 (pp. 924-927). Article 7181075 (2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TRANSDUCERS.2015.7181075

Microheater multilayer interference to reduce thermal emission for low photon number luminescence measurement. / Armstrong, P. R.; Mah, Merlin L; Olson, K. D. et al.
2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 924-927 7181075 (2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Armstrong, PR, Mah, ML, Olson, KD & Talghader, JJ 2015, Microheater multilayer interference to reduce thermal emission for low photon number luminescence measurement. in 2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015., 7181075, 2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015, Institute of Electrical and Electronics Engineers Inc., pp. 924-927, 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015, Anchorage, United States, 6/21/15. https://doi.org/10.1109/TRANSDUCERS.2015.7181075

Armstrong PR, Mah ML, Olson KD, Talghader JJ. Microheater multilayer interference to reduce thermal emission for low photon number luminescence measurement. In 2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 924-927. 7181075. (2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015). doi: 10.1109/TRANSDUCERS.2015.7181075

Armstrong, P. R. ; Mah, Merlin L ; Olson, K. D. et al. / Microheater multilayer interference to reduce thermal emission for low photon number luminescence measurement. 2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 924-927 (2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015).

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title = "Microheater multilayer interference to reduce thermal emission for low photon number luminescence measurement",

abstract = "Under low light conditions, high temperature measurements of luminescence are limited by the overlap of the thermal emission spectra and the luminescent emission spectra being measured. A solution to this is to have a heat source that can be designed not to emit in a certain wavelength range(s) by coating it with an interference multilayer. The multilayer effectively changes the emissivity of the heat source. Microheaters made from aluminum oxide platforms with platinum heating elements were coated with aluminum oxide and titanium oxide multilayers. This multilayer structure was used to measure the thermoluminescence of CaSO4:Ce,Tb up to 420°C. They also showed a thermal emission background 800 times lower at 600°C than the same microheater with no multilayer structure.",

keywords = "microheaters, optical coatings, thermoluminescence",

author = "Armstrong, {P. R.} and Mah, {Merlin L} and Olson, {K. D.} and Talghader, {Joseph J}",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 18th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2015 ; Conference date: 21-06-2015 Through 25-06-2015",

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AU - Armstrong, P. R.

AU - Mah, Merlin L

AU - Olson, K. D.

AU - Talghader, Joseph J

PY - 2015/8/5

Y1 - 2015/8/5

N2 - Under low light conditions, high temperature measurements of luminescence are limited by the overlap of the thermal emission spectra and the luminescent emission spectra being measured. A solution to this is to have a heat source that can be designed not to emit in a certain wavelength range(s) by coating it with an interference multilayer. The multilayer effectively changes the emissivity of the heat source. Microheaters made from aluminum oxide platforms with platinum heating elements were coated with aluminum oxide and titanium oxide multilayers. This multilayer structure was used to measure the thermoluminescence of CaSO4:Ce,Tb up to 420°C. They also showed a thermal emission background 800 times lower at 600°C than the same microheater with no multilayer structure.

AB - Under low light conditions, high temperature measurements of luminescence are limited by the overlap of the thermal emission spectra and the luminescent emission spectra being measured. A solution to this is to have a heat source that can be designed not to emit in a certain wavelength range(s) by coating it with an interference multilayer. The multilayer effectively changes the emissivity of the heat source. Microheaters made from aluminum oxide platforms with platinum heating elements were coated with aluminum oxide and titanium oxide multilayers. This multilayer structure was used to measure the thermoluminescence of CaSO4:Ce,Tb up to 420°C. They also showed a thermal emission background 800 times lower at 600°C than the same microheater with no multilayer structure.

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KW - optical coatings

KW - thermoluminescence

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Y2 - 21 June 2015 through 25 June 2015

ER -

Microheater multilayer interference to reduce thermal emission for low photon number luminescence measurement

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