Metal-oxide-semiconductor capacitors fabricated by layer-by-layer nanoassembly and microfabrication

Yuxin Liu, Tianhong Cui

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

Metal oxide semiconductor (MOS) capacitors were fabricated by electrostatic layer-by-layer self-assembly (LbL-SA) combined with a modified lift-off technique. The MOS capacitors were built on both n-type and p-type silicon substrates. The numbers of silicon dioxide (SiO 2) nanoparticle layers were varied to characterize the electrical performance of MOS capacitors. Unlike the conventional process, LbL-SA allows us to deposit the thin films for a semiconductor device with a lower temperature, lower cost, and shorter processing time. The stability of the silica insulation layers was also investigated. Atomic force microscopy (AFM) served to monitor the film quality of the self-assembled thin films.

Original languageEnglish (US)
Pages (from-to)192-197
Number of pages6
JournalJournal of Nanoscience and Nanotechnology
Volume5
Issue number2
DOIs
StatePublished - Dec 1 2005

Keywords

  • Capacitors
  • Layer-by-Layer Assembly
  • Metal Oxide Semiconductor
  • Nanoassembly

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