Measuring non-uniformities in GaN/AIN quantum wells

K. A. Mkhoyan, H. Wu, W. J. Schaff, L. F. Eastman, J. Silcox

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)816-817
Number of pages2
JournalMicroscopy and Microanalysis
Volume9
Issue numberSUPPL. 2
DOIs
StatePublished - 2003

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