Measuring dynamic phenomena at the sub-micron scale

Julio Soria, Omid Amili, Callum Atkinson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

measuring the spatio-temporal evolution of dynamic phenomena at sub-micron level is non-trivial due to the diffraction limit of optical systems. This paper describes a technique which allows imaging of sub-micron features of fluid-based phenomena, specifically the determination of their velocity and trajectory.

Original languageEnglish (US)
Title of host publicationProceedings of the 2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008
Pages129-132
Number of pages4
DOIs
StatePublished - Nov 24 2008
Event2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008 - Melbourne, VIC, Australia
Duration: Feb 25 2008Feb 29 2008

Publication series

NameProceedings of the 2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008

Other

Other2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008
Country/TerritoryAustralia
CityMelbourne, VIC
Period2/25/082/29/08

Keywords

  • Component; sub-micron phenomena
  • Dynamics
  • Holography
  • PIV

Fingerprint

Dive into the research topics of 'Measuring dynamic phenomena at the sub-micron scale'. Together they form a unique fingerprint.

Cite this