Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution

M. Kozina, T. Hu, J. S. Wittenberg, E. Szilagyi, M. Trigo, T. A. Miller, C. Uher, A. Damodaran, L. Martin, A. Mehta, J. Corbett, J. Safranek, D. A. Reis, A. M. Lindenberg

Research output: Contribution to journal › Article › peer-review