Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution

M. Kozina, T. Hu, J. S. Wittenberg, E. Szilagyi, M. Trigo, T. A. Miller, C. Uher, A. Damodaran, L. Martin, A. Mehta, J. Corbett, J. Safranek, D. A. Reis, A. M. Lindenberg

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