Measurement of the effects of the localized field of a magnetic force microscope tip on a 180° domain wall

Sheryl Foss, E. Dan Dahlberg, Roger Proksch, Bruce M. Moskowitz

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Opposite polarity magnetic force microscope (MFM) profiles of domain walls (DWs) in magnetite were measured with a commercial MFM tip magnetized in opposite directions perpendicular to the sample surface. The influence of the tip field on a DW resulted in an overall more attractive interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip. The dependence of the measured alteration on tip-sample separation was fit with a power law at different positions across the DW. The rate of decay of the alteration with tip-sample separation, quantified by the exponent of the power law fit, varied across the DW and was much slower than expected from a simple model.

Original languageEnglish (US)
Pages (from-to)5032-5034
Number of pages3
JournalJournal of Applied Physics
Volume81
Issue number8 PART 2B
DOIs
StatePublished - Apr 15 1997

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