Measurement of Sputtering Yields and Ion Beam Damage to Organic Thin Films with the Quartz Crystal Microbalance

Dale M. Ullevig, John F Evans

Research output: Contribution to journalArticlepeer-review

34 Scopus citations

Fingerprint

Dive into the research topics of 'Measurement of Sputtering Yields and Ion Beam Damage to Organic Thin Films with the Quartz Crystal Microbalance'. Together they form a unique fingerprint.

Keyphrases

Engineering

Chemistry

Material Science

Chemical Engineering